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International Journal of Pure & Applied Bioscience (IJPAB)
Year : 2017, Volume : 5, Issue : 6
First page : (809) Last page : (816)
Article doi: http://dx.doi.org/10.18782/2320-7051.5230

Inter-Generation Correlation and Regression Analysis in F2 and F3 Generations of Wheat

Khushboo Singh*, M. S. Punia, Vikram Singh and Vijay Jagdale
Department of Genetics and Plant Breeding, CCS Haryana Agricultural University,
Hisar - 125004, Haryana India
*Corresponding Author E-mail: singh01khushboo@gmail.com
Received: 16.07.2017  |  Revised: 22.08.2017   |  Accepted: 27.08.2017  


In the present study F2 and F3 population of four crosses of bread wheat (Triticum aestivum L.) were evaluated for yield and yield contributing traits. Parent progeny regression analysis involving F2 and F3 generation of four crosses in wheat was undertaken to estimate the genetic potential transferred from one generation to other by selection for single plant yield. The results revealed that significant positive inter-generation correlation and regression was observed for character like plant height in all four crosses Raj3765 x Syn 27, WH1105 x Syn27, Raj3765 x WH711 and WH1105 x WH711 and grain yield per plant was found significant in crosses Raj3765 x Syn 27 and WH1105 x Syn27. It indicates the chances of selecting high yielding genotypes at early generations. The narrow sense heritability for different characters based on parent offspring regression coefficient was high for 100 grain weight in all crosses. Higher the narrow sense heritability, higher is the chances of improving the characters through selection. Hence, 100 grain weight and grain yield per plant has the better chances of improvement through selection.

Key words: Wheat, Inter-Generation Correlation, Regression, Selection.

Full Text : PDF; Journal doi : http://dx.doi.org/10.18782

Cite this article: Singh, K., Punia M.S., Singh V. and Jagdale V., Inter-Generation Correlation and Regression Analysis in F2 and F3 Generations of Wheat, Int. J. Pure App. Biosci.5(6): 809-816 (2017). doi: http://dx.doi.org/10.18782/2320-7051.5230