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International Journal of Pure & Applied Bioscience (IJPAB)
Year : 2018, Volume : 6, Issue : 3
First page : (686) Last page : (693)
Article doi: : http://dx.doi.org/10.18782/2320-6266

Genetic Divergence Analysis for Grain Yield, Its Components and Quality Traits under Normal and Heat Stress Environments in Bread Wheat

Preeti, I. S. Panwar* and Vikram Singh

Department of Genetics & Plant Breeding,
CCS Haryana Agricultural University, Hisar (Haryana) - 125004, India
*Corresponding Author E-mail: preeti.hau@gmail.com
Received: 19.02.2018  |  Revised: 25.03.2018   |  Accepted: 7.04.2018  

 ABSTRACT

The genetic divergence among 75 genotypes of bread wheat was assessed for 12 grain yield, its components and quality traits of bread wheat under normal and heat stress environment. Significant genotypic differences were observed for all the characters under both environments. Based on Euclidean cluster analysis,75 genotypes were grouped into 9 clusters under both normal and heat stress environment. Cluster VIII was the largest cluster consisting of 15 genotypes followed by cluster III (12 genotypes) in normal environment while heat stress environment most of genotypes were grouped in  cluster V (13 genotypes) and in cluster VII (12 genotypes). The genotypes of cluster VII, VIII and IX were identified as diverse as well as having higher mean values for most of the yield traits in both environments. Hybridization involving genotype of cluster VII and IX in timely sown conditions and clusters VII and VIII in late sown conditions  is advocated in order to achieve high yielding segregants based on high performance for grain yield and quality traits and genetic divergence. The genotypes viz. PBW175, DBW88, HD2967, WH1105, WH542 and WH711 were found high yielding and divergent in timely sown conditions while genotypes WH542, WH1142, DBW88, DBW90, WH1124 and WH1021 were found high yielding and heat stress tolerant in late sown conditions.
Key words: Genetic divergence, Cluster, Grain Yield, Heat stress.

Full Text : PDF; Journal doi : http://dx.doi.org/10.18782

Cite this article: Panwar, P.I.S. and Singh, V., Genetic Divergence Analysis for Grain Yield, Its Components and Quality Traits under Normal and Heat Stress Environments in Bread Wheat, Int. J. Pure App. Biosci.6(3): 686-693 (2018). doi: http://dx.doi.org/10.18782/2320-7051.6266